Error Sources
What Separates Laboratory from Industrial Accuracy
A perfect strain-gauge cell would produce output exactly proportional to applied load across its full range, with zero drift, zero hysteresis, and zero temperature dependence. Real cells approach that ideal but never reach it. Five error sources dominate real-world cell performance:
Nonlinearity
Deviation from a perfectly straight load-versus-output curve. A ±0.02% nonlinearity cell reads within 0.02% of the ideal line at every 25% capacity increment. Nonlinearity accumulates from elastic-element machining tolerances, gauge bonding consistency, and bridge resistor matching.
Hysteresis
Difference between increasing-load and decreasing-load curves at the same applied force. A cell might read 100.00% at rated capacity on the way up and 100.02% at the same 100% point on the way down. Hysteresis results from internal friction in the elastic element and gauge adhesive; it is reduced by heat-treating the element and using low-creep epoxies.
Creep
Gradual output drift under constant applied load over minutes to hours. Specified typically as percentage of output after 30 minutes at rated capacity. Creep matters most for static weighing applications (tank inventory, batch scales) where load stays applied for extended periods.
Zero Balance and Drift
Zero balance is the cell’s no-load output; ideally zero, typically ±1% of rated output from manufacturing variance. Zero drifts over time from gauge aging, residual stress in the element, and temperature cycling. A 10-year-old cell’s zero can drift 0.3–0.5% of rated output — recoverable through recalibration but indicative of accumulated mechanical history.
Temperature Effects on Zero and Span
Both zero balance and span (rated output at rated capacity) shift with temperature outside the compensated range. Specified as percentage per degree Celsius; typical values are 0.0005% per °C for both zero and span on well-compensated industrial cells. Operating outside the compensated range introduces measurable drift that looks like cell failure but is a spec-within-spec thermal excursion.